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 SSFP30N20
StarMOST Power MOSFET

Extremely high dv/dt capability Low Gate Charge Qg results in Simple Drive Requirement 100% avalanche tested Gate charge minimized Very low intrinsic capacitances Very good manufacturing repeatability
VDSS = 200V ID25 = 30A RDS(ON) = 0.085

Description
StarMOS is a new generation of high voltage N-Channel enhancement mode power MOSFETs. This new technology minimises the JFET effect, increases packing density and reduces the on-resistance. StarMOS also achieves faster switching speeds through optimised gate layout with planar stripe DMOS technology.
Pin1-Gate Pin2-Drain Pin1-Source
Application
Switching application
Absolute Maximum Ratings
Parameter ID@Tc=25 C ID@Tc=100C IDM PD@TC=25C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current,VGS@10V Continuous Drain Current,VGS@10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current

Max. 30 19 120 190 1.5 20 410 30 19 5.0 -55 to +150 300(1.6mm from case) 10 Ibfin(1.1Nm)
Units A W W/ C V mJ A mJ V/ns C
Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range
Soldering Temperature, for 10 seconds Mounting Torque,6-32 or M3 screw
Thermal Resistance
Parameter RJC RCS RJA Junction-to-case Case-to-Sink,Flat,Greased Surface Junction-to-Ambient Min. -- -- -- Typ. -- 0.24 -- Max. 0.65 -- 40 C/W Units
1
SSFP30N20
StarMOST Power MOSFET
Electrical Characteristics @TJ=25 C(unless otherwise specified)
Parameter V(BR)DSS RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD Drain-to-Source Breakdown Voltage Static Drain-to-Source On-resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage current Gate-to-Source Forward leakage Gate-to-Source Reverse leakage Total Gate Charge Gate-to-Source charge Gate-to-Drain("Miller") charge Turn-on Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance
V(BR)DSS/TJ Breakdown Voltage Temp.Coefficient
Min. 200 -- -- 2.0 12 -- -- -- -- -- -- -- -- -- -- -- --
Typ. -- 0.27 -- -- -- -- -- -- -- -- -- -- 16 86 70 62 5.0
Max. Units -- -- 0.085 4.0 -- 25 250 100 -100 140 28 74 -- -- -- -- -- V
Test Conditions VGS=0V,ID=250A
V/C Reference to 25C,ID=1mA VGS=10V,ID=18A V S A nA VDS=40V,ID=18A VDS=200V,VGS=0V VDS=160V,VGS=0V,TJ=150C VGS=20V VGS=-20V VDS=VGS,ID=250A
ID=30A nC VDS=160V VGS=10V VDD=100V ID=30A nS RG=6.2 RD=3.2 Between lead, 6mm(0.25in.) nH from package and center of die contact VGS=0V pF VDS=25V
f=1.0MHZ
LS Ciss Coss Crss
Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance
-- -- -- --
13 2800 780 250
-- -- -- --
Source-Drain Ratings and Characteristics
Parameter IS ISM VSD trr Qrr ton Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-on Time . . Min. -- -- -- -- -- Typ. -- -- -- 360 4.6 Max. 30 A 120 2.0 540 6.9 V nS C Units Test Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ=25C,IS=30A,VGS=0V TJ=25C,IF=30A di/dt=100A/s
Intrinsic turn-on time is negligible (turn-on is dominated by Ls + LD)
Notes: Repetitive rating;pulse width limited by max.junction temperature(see figure 11)
ISD30A,di/dt190A/S,VDDV(BR)DSS, TJ25 C Pulse width300S; duty cycle2%
L = 0.683mH, IAS = 30 A, VDD = 50V,
RG = 25, Starting TJ = 25C
2


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